3260BWayne Kerr?3260B?測試分析儀
Wayne Kerr 公司的WK-3260B測試分析儀,除基本的LCR及阻抗等測試功能外,還具備直流偏壓和圈比測試,是一款偏重于變壓器等磁性元件而設計的.由于測試精度高,功能多,方便操作,目前絕大多數高端客戶都采用這種設備.相對于HP的測試儀器來講,操作方便,易上手,精度高,更受工程師喜愛.配備的DC BIAS最大可到125A.
At the design stage of component development it is vitally important to understand how the component performs under different operating conditions. This might include operation at diverse frequencies, AC drive levels or DC bias currents.The 3260B Precision Magnetics Analyzer can plot any of the measurement functions, such as inductance (L) or impedance (Z), (including secondary term) against frequency, AC drive level or DC bias current.
Frequency sweeps within the range 20 Hz to 3 MHz can be selected. There is a choice of either linear or logarithmic frequency displays.3260B is especially suitable for measuring parameters on telecom transformers.The selected measurement parameter and its secondary value are presented graphically. AC drive levels can be set between 1 mV and 10 V. DC bias current can be set from 1 mA to 1 A internally. Using external 3265B 25 A DC Bias Units bias currents can be set to a maximum of 125 A.
Measure Insertion Loss and Return Loss on telecom transformersWith the dramatic growth of PCs connected to the telephone system for Internet access has come the requirement to measure Insertion Loss (IL) and Return Loss (RL) of line matching transformers.The 3260B Precision Magnetics Analyzer not only measures IL and RL has this capability. but the instrument also allows the user to enter the values for terminating resistance or impedance, if complex, and to select a damped network or blocking capacitor if required.Specification summary
Z, ?, L, C, Rac, Rdc, Q, DTurns RatioPrimary and secondary Leakage InductanceInterwinding CapacitanceResonant FrequencyFrequency ranges 20 Hz to 3 MHzBasic accuracy 0.1%Mode Analysis (graphing)TelecomMulti FrequencySequenceDC bias current 1 mA to 1 A (internal)Up to 125 A (using five 3265B DC Bias Units)Interface GPIBMeasurement speed Up to 20 measurements/secPrinted output of test resultsUsing the parallel Centronics interface the user can directly print test results including graphs for further analysis and archiving.In addition, via the IEEE488 GPIB interface, the instrument can be controlled from a PC and results can be read back for analysis and storage. LabVIEW? drivers are available upon request or may be downloaded from this website providing a base from which a user can develop a specific test application.Bin sortThe bin sorting function allows component manufacturers to sort components in up to ten bins. Sorting is carried out either by absolute values or by percentage of values.Component tests with up to 125 A DC bias current 
